DocumentCode :
2466149
Title :
Combining classifiers
Author :
Kittler, J. ; Hater, M. ; Duin, R.P.W.
Author_Institution :
Dept. of Electron. & Electr. Eng., Surrey Univ., Guildford, UK
Volume :
2
fYear :
1996
fDate :
25-29 Aug 1996
Firstpage :
897
Abstract :
We develop a common theoretical framework for combining classifiers which use distinct pattern representations and show that many existing schemes can be considered as special cases of compound classification where all the pattern representations are used jointly to make a decision. An experimental comparison of various classifier combination schemes demonstrates that the combination rule developed under the most restrictive assumptions-the sum rule-and its derivatives consistently outperform other classifier combinations schemes. A sensitivity analysis of the various schemes to estimation errors is carried out to show that this finding can be justified theoretically
Keywords :
pattern classification; classifier combination; compound classification; pattern representations; sensitivity analysis; sum rule; Decision making; Estimation error; Extraterrestrial measurements; Machinery; Pattern recognition; Physics; Sensitivity analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 1996., Proceedings of the 13th International Conference on
Conference_Location :
Vienna
ISSN :
1051-4651
Print_ISBN :
0-8186-7282-X
Type :
conf
DOI :
10.1109/ICPR.1996.547205
Filename :
547205
Link To Document :
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