Title : 
Spin tunnel junctions for memory and read-bead uplications
         
        
            Author : 
Freitas, P.P. ; Cardoso, S. ; Sousa, R.C. ; Wanjun Ku ; Ferreira, R.
         
        
            Author_Institution : 
INESC
         
        
        
        
        
        
            Keywords : 
Diodes; Electrodes; Fabrication; Glass; Oxidation; Plasma sources; Plasma temperature; Random access memory; Temperature dependence; Tunneling magnetoresistance;
         
        
        
        
            Conference_Titel : 
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
         
        
            Conference_Location : 
Toronto, ON, Canada
         
        
            Print_ISBN : 
0-7803-5943-7
         
        
        
            DOI : 
10.1109/INTMAG.2000.872276