Title :
Spin tunnel junctions for memory and read-bead uplications
Author :
Freitas, P.P. ; Cardoso, S. ; Sousa, R.C. ; Wanjun Ku ; Ferreira, R.
Author_Institution :
INESC
Keywords :
Diodes; Electrodes; Fabrication; Glass; Oxidation; Plasma sources; Plasma temperature; Random access memory; Temperature dependence; Tunneling magnetoresistance;
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
DOI :
10.1109/INTMAG.2000.872276