DocumentCode
2466187
Title
Two degree of freedom control for nanopositioning systems: Fundamental limitations, control design, and related trade-offs
Author
Lee, Chibum ; Salapaka, Srinivasa M.
Author_Institution
Dept. of Mech. Sci. & Eng., Univ. of Illinois, Urbana, IL, USA
fYear
2009
fDate
10-12 June 2009
Firstpage
1664
Lastpage
1669
Abstract
This paper studies and analyzes fundamental trade-offs between positioning resolution, tracking bandwidth and robustness to modeling uncertainties in two-degree-of-freedom (2DOF) control designs for nanopositioning systems. The analysis of these systems is done in optimal control setting with various architectural constraints imposed on the 2DOF framework. In terms of these trade-offs, our analysis shows that the primary role of feedback is providing robustness to the closed-loop device whereas the feedforward component is mainly effective in overcoming fundamental algebraic constraints that limit the feedback-only designs. This paper presents (1) an optimal prefilter model matching design for a system with an existing feedback controller and (2) a simultaneous feedforward and feedback control design in an optimal Hinfin mixed sensitivity framework. The experimental results on applying these controllers show a significant improvement, as high as 330% increase in bandwidth for similar robustness and resolution level over optimal feedback-only designs. Other performance objectives are similarly improved.We demonstrate that the 2DOF freedom design achieves performance specifications that are analytically impossible for the feedback-only design.
Keywords
Hinfin control; control system synthesis; feedback; feedforward; nanopositioning; physical instrumentation control; sensitivity analysis; Hinfin mixed sensitivity framework; atomic force microscopy; closed-loop device; feedback controller design; feedforward control design; nanopositioning systems; optimal control setting; optimal prefilter model matching design; scanning probe microscopy; tracking bandwidth; two-degree-of-freedom control designs; Adaptive control; Bandwidth; Control design; Control systems; Feedback; Nanopositioning; Optimal control; Robust control; Robustness; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 2009. ACC '09.
Conference_Location
St. Louis, MO
ISSN
0743-1619
Print_ISBN
978-1-4244-4523-3
Electronic_ISBN
0743-1619
Type
conf
DOI
10.1109/ACC.2009.5160185
Filename
5160185
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