• DocumentCode
    2466187
  • Title

    Two degree of freedom control for nanopositioning systems: Fundamental limitations, control design, and related trade-offs

  • Author

    Lee, Chibum ; Salapaka, Srinivasa M.

  • Author_Institution
    Dept. of Mech. Sci. & Eng., Univ. of Illinois, Urbana, IL, USA
  • fYear
    2009
  • fDate
    10-12 June 2009
  • Firstpage
    1664
  • Lastpage
    1669
  • Abstract
    This paper studies and analyzes fundamental trade-offs between positioning resolution, tracking bandwidth and robustness to modeling uncertainties in two-degree-of-freedom (2DOF) control designs for nanopositioning systems. The analysis of these systems is done in optimal control setting with various architectural constraints imposed on the 2DOF framework. In terms of these trade-offs, our analysis shows that the primary role of feedback is providing robustness to the closed-loop device whereas the feedforward component is mainly effective in overcoming fundamental algebraic constraints that limit the feedback-only designs. This paper presents (1) an optimal prefilter model matching design for a system with an existing feedback controller and (2) a simultaneous feedforward and feedback control design in an optimal Hinfin mixed sensitivity framework. The experimental results on applying these controllers show a significant improvement, as high as 330% increase in bandwidth for similar robustness and resolution level over optimal feedback-only designs. Other performance objectives are similarly improved.We demonstrate that the 2DOF freedom design achieves performance specifications that are analytically impossible for the feedback-only design.
  • Keywords
    Hinfin control; control system synthesis; feedback; feedforward; nanopositioning; physical instrumentation control; sensitivity analysis; Hinfin mixed sensitivity framework; atomic force microscopy; closed-loop device; feedback controller design; feedforward control design; nanopositioning systems; optimal control setting; optimal prefilter model matching design; scanning probe microscopy; tracking bandwidth; two-degree-of-freedom control designs; Adaptive control; Bandwidth; Control design; Control systems; Feedback; Nanopositioning; Optimal control; Robust control; Robustness; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2009. ACC '09.
  • Conference_Location
    St. Louis, MO
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4244-4523-3
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2009.5160185
  • Filename
    5160185