DocumentCode :
2466199
Title :
Electrostatic discharge testing of tunneling magnetoresistive (TMR) devices
Author :
Wallash, Albert ; Hillman, J. ; Sharma, M. ; Wang, S.X.
Author_Institution :
Quanturn Corporation
fYear :
2000
fDate :
9-13 April 2000
Firstpage :
504
Lastpage :
504
Keywords :
Biological system modeling; Breakdown voltage; Capacitors; Circuit testing; Electrostatic discharge; Giant magnetoresistance; Magnetic heads; SPICE; Semiconductor device testing; Tunneling magnetoresistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
Type :
conf
DOI :
10.1109/INTMAG.2000.872279
Filename :
872279
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2466199
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