Title :
Quick estimation and sensitivity analysis of Pierce electron gun parameters
Author :
Sharma, RK ; Sinha, AK ; Joshi, SN ; Sancheti, S.
Author_Institution :
CTG, Central Electron. Eng. Res. Inst., Pilani, India
Abstract :
Summary form only given. Pierce type convergent electron guns are the unique choice for linear beam microwave tubes. As a general practice for the design of these electron guns based on four electrical parameters, e.g. beam voltage (V), beam current (I), beam minimum diameter or beam waist (2rw) and cathode emission current density (Jc), an initial estimation of the electron gun geometry including half beam cone angle (θ), axial gap between cathode and anode (Zac), axial location of beam waist with respect to cathode (Zw), etc., is done through the synthesis approach. Then, the gun geometry thus obtained is fed as input into analytical software for the final design and optimisation of the electron gun geometry. A thorough study related to synthesis and analysis of electron guns has been carried out by the authors. In this abstract, a sensitivity analysis of different parameters of Pierce electron guns with respect to two basic input parameters like beam perveance (μP) and beam waist radius (rw) has been presented.
Keywords :
cathodes; current density; electron beams; electron guns; electronic design automation; optimisation; parameter estimation; Pierce electron gun parameters; Pierce type convergent electron guns; analytical software; beam current; beam minimum diameter; beam perveance; beam voltage; beam waist; beam waist axial location; beam waist radius; cathode anode axial gap; cathode emission current density; electrical parameters; electron gun geometry estimation; electron gun geometry optimisation; electron guns; half beam cone angle; input parameters; linear beam microwave tubes; parameter estimation; sensitivity analysis; Anodes; Cathodes; Current density; Electron beams; Electron emission; Electron guns; Electron tubes; Geometry; Sensitivity analysis; Voltage;
Conference_Titel :
Vacuum Electronics Conference, 2002. IVEC 2002. Third IEEE International
Print_ISBN :
0-7803-7256-5
DOI :
10.1109/IVELEC.2002.999286