DocumentCode
2467024
Title
Polysilicon nanowire chemical sensor based on CMOS standard process
Author
Huang, C.-W. ; Hsu, S.-C. ; Lin, C.-T.
Author_Institution
Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei
fYear
2008
fDate
8-10 Dec. 2008
Firstpage
1
Lastpage
4
Abstract
Based on the improvements of the lithography technology, the dimension of the device has decreased to nanometer. On the other hand, silicon nanowire has been proposed to detect proteins, DNA, and ions etc. In general, the silicon nanowires are made either by CVD (chemical vapor deposition) or by silicon on insulator (SOI) fabrication process. The former has trouble in electrodes arranging and the latter suffers from more expensive than standard semiconductor process. In this work, we announced CMOS compatible technique which is used to develop polysilicon nanowire field effect transistor as a chemical sensor with low cost and high fidelity to pave the way toward system-on-chip design.
Keywords
CMOS integrated circuits; chemical sensors; lab-on-a-chip; nanowires; silicon; system-on-chip; CMOS standard process; Si; polysilicon nanowire chemical sensor; polysilicon nanowire field effect transistor; system-on-chip; CMOS process; CMOS technology; Chemical sensors; Chemical technology; Chemical vapor deposition; DNA; Lithography; Nanoscale devices; Proteins; Silicon on insulator technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices and Solid-State Circuits, 2008. EDSSC 2008. IEEE International Conference on
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-2539-6
Electronic_ISBN
978-1-4244-2540-2
Type
conf
DOI
10.1109/EDSSC.2008.4760705
Filename
4760705
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