DocumentCode :
2467024
Title :
Polysilicon nanowire chemical sensor based on CMOS standard process
Author :
Huang, C.-W. ; Hsu, S.-C. ; Lin, C.-T.
Author_Institution :
Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei
fYear :
2008
fDate :
8-10 Dec. 2008
Firstpage :
1
Lastpage :
4
Abstract :
Based on the improvements of the lithography technology, the dimension of the device has decreased to nanometer. On the other hand, silicon nanowire has been proposed to detect proteins, DNA, and ions etc. In general, the silicon nanowires are made either by CVD (chemical vapor deposition) or by silicon on insulator (SOI) fabrication process. The former has trouble in electrodes arranging and the latter suffers from more expensive than standard semiconductor process. In this work, we announced CMOS compatible technique which is used to develop polysilicon nanowire field effect transistor as a chemical sensor with low cost and high fidelity to pave the way toward system-on-chip design.
Keywords :
CMOS integrated circuits; chemical sensors; lab-on-a-chip; nanowires; silicon; system-on-chip; CMOS standard process; Si; polysilicon nanowire chemical sensor; polysilicon nanowire field effect transistor; system-on-chip; CMOS process; CMOS technology; Chemical sensors; Chemical technology; Chemical vapor deposition; DNA; Lithography; Nanoscale devices; Proteins; Silicon on insulator technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits, 2008. EDSSC 2008. IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-2539-6
Electronic_ISBN :
978-1-4244-2540-2
Type :
conf
DOI :
10.1109/EDSSC.2008.4760705
Filename :
4760705
Link To Document :
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