• DocumentCode
    2467024
  • Title

    Polysilicon nanowire chemical sensor based on CMOS standard process

  • Author

    Huang, C.-W. ; Hsu, S.-C. ; Lin, C.-T.

  • Author_Institution
    Grad. Inst. of Electron. Eng., Nat. Taiwan Univ., Taipei
  • fYear
    2008
  • fDate
    8-10 Dec. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Based on the improvements of the lithography technology, the dimension of the device has decreased to nanometer. On the other hand, silicon nanowire has been proposed to detect proteins, DNA, and ions etc. In general, the silicon nanowires are made either by CVD (chemical vapor deposition) or by silicon on insulator (SOI) fabrication process. The former has trouble in electrodes arranging and the latter suffers from more expensive than standard semiconductor process. In this work, we announced CMOS compatible technique which is used to develop polysilicon nanowire field effect transistor as a chemical sensor with low cost and high fidelity to pave the way toward system-on-chip design.
  • Keywords
    CMOS integrated circuits; chemical sensors; lab-on-a-chip; nanowires; silicon; system-on-chip; CMOS standard process; Si; polysilicon nanowire chemical sensor; polysilicon nanowire field effect transistor; system-on-chip; CMOS process; CMOS technology; Chemical sensors; Chemical technology; Chemical vapor deposition; DNA; Lithography; Nanoscale devices; Proteins; Silicon on insulator technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits, 2008. EDSSC 2008. IEEE International Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-2539-6
  • Electronic_ISBN
    978-1-4244-2540-2
  • Type

    conf

  • DOI
    10.1109/EDSSC.2008.4760705
  • Filename
    4760705