DocumentCode
2467216
Title
Voltage gradient limitation of IGBTS by optimised gate-current profiles
Author
Schmitt, G. ; Kennel, R. ; Holtz, J.
Author_Institution
Electr. Machines & Drives, Wuppertal Univ., Wuppertal
fYear
2008
fDate
15-19 June 2008
Firstpage
3592
Lastpage
3596
Abstract
Using MOS-controlled semiconductors provide the opportunity to directly affect the voltage and currents gradients during the switching transients at the gate. An active gate driver is presented that imposes optimised gate current profiles in order to limit the dv/dt and di/dt. When limiting the dv/dt to 1 kV/mus the switching losses are be reduced by 35% in comparison to the common limitation method by gate resistor. The switch-off losses are improved about 10% by employing an optimised gate signal.
Keywords
MOSFET; driver circuits; insulated gate bipolar transistors; losses; power semiconductor devices; resistors; transient analysis; IGBT; MOS-controlled semiconductors; active gate driver; currents gradients; gate resistor; optimised gate-current profiles; switching losses; switching transients; voltage gradient limitation; Costs; Driver circuits; Filters; Flexible AC transmission systems; Insulated gate bipolar transistors; Medium voltage; Power semiconductor switches; Resistors; Stress; Switching loss;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics Specialists Conference, 2008. PESC 2008. IEEE
Conference_Location
Rhodes
ISSN
0275-9306
Print_ISBN
978-1-4244-1667-7
Electronic_ISBN
0275-9306
Type
conf
DOI
10.1109/PESC.2008.4592512
Filename
4592512
Link To Document