DocumentCode :
2467357
Title :
Out-of-norm assertions [diagnostic mechanism]
Author :
Peti, Philipp ; Obermaisser, Roman ; Kopetz, Hermann
Author_Institution :
Vienna Univ. of Technol., Austria
fYear :
2005
fDate :
7-10 March 2005
Firstpage :
280
Lastpage :
291
Abstract :
The increasing use of electronics in transport systems, such as the automotive and avionic domain, has lead to dramatic improvements with respect to functionality, safety, and cost. However, with this growth of electronics the likelihood of failures due to faults originating from electronic equipment also increases. Although permanent failure rates are constantly diminishing due to improvements in manufacturing, the downsizing of semiconductor features has lead to a significant increase in transient system disturbances. Furthermore, transients are frequently the precursors of upcoming permanent failures. In order to cope with this development, a diagnostic subsystem must especially be designed to detect and analyze such transients to reduce the failure-not-found ratio in today´s systems. Therefore, diagnostic detection mechanisms must be devised that refrain from traditional error detection techniques operating only on component-local data in favor of a system-wide view to detect and analyze correlated failures and infer the corresponding fault. In this work, we present out-of-norm assertions (ONAs) as a diagnostic mechanism operating on the distributed state to detect correlated component malfunction. ONAs take the characteristics of faults in the time, value and space domain into account in order to discriminate between different types of faults that are affecting the operation of the distributed system. Since ONAs are specified on the interface state mutual error detection of interface state variables is performed. In contrast to bivalent assertions that need to indisputably decide on correct or incorrect system states at the time of occurrence, the proposed ONAs are also useful in the detection of system irregularities that cannot be forced into the predominant bivalent assessment scheme.
Keywords :
automotive electronics; distributed processing; electronic engineering computing; embedded systems; error detection; failure analysis; fault diagnosis; bivalent assessment scheme; correlated component malfunction detection; correlated failures analysis; distributed system; electronic equipment; error detection techniques; out-of-norm assertion diagnostic mechanism; semiconductor features downsizing; transient system disturbances; transport systems; Aerospace electronics; Automotive engineering; Cost function; Electronic equipment; Electronic equipment manufacture; Failure analysis; Fault detection; Interface states; Safety; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Real Time and Embedded Technology and Applications Symposium, 2005. RTAS 2005. 11th IEEE
ISSN :
1080-1812
Print_ISBN :
0-7695-2302-1
Type :
conf
DOI :
10.1109/RTAS.2005.38
Filename :
1388394
Link To Document :
بازگشت