• DocumentCode
    2467393
  • Title

    Credit risk evaluation with extreme learning machine

  • Author

    Zhou, Hongming ; Lan, Yuan ; Soh, Yeng Chai ; Huang, Guang-Bin ; Zhang, Rui

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2012
  • fDate
    14-17 Oct. 2012
  • Firstpage
    1064
  • Lastpage
    1069
  • Abstract
    Credit risk evaluation has become an increasingly important field in financial risk management for financial institutions, especially for banks and credit card companies. Many data mining and statistical methods have been applied to this field. Extreme learning machine (ELM) classifier as a type of generalized single hidden layer feed-forward networks has been used in many applications and achieve good classification accuracy. Thus, we use ELM (kernel based) as a classification tool to perform the credit risk evaluation in this paper. The simulations are done on two credit risk evaluation datasets with three different kernel functions. Simulation results show that the kernel based ELM is more suitable for credit risk evaluation than the popular used Support Vector Machines (SVMs) with consideration of overall, good and bad accuracies.
  • Keywords
    data mining; feedforward neural nets; financial data processing; generalisation (artificial intelligence); learning (artificial intelligence); pattern classification; risk management; statistical analysis; bank; classification accuracy; credit card company; credit risk evaluation; data mining; extreme learning machine classifier; financial institution; financial risk management; generalized single hidden layer feed-forward network; statistical method; Accuracy; Kernel; Machine learning; Polynomials; Support vector machines; Training; Training data; Confusion Matrix; Credit Risk Evaluation; Extreme learning machine (ELM); Support Vector Machine (SVM);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems, Man, and Cybernetics (SMC), 2012 IEEE International Conference on
  • Conference_Location
    Seoul
  • Print_ISBN
    978-1-4673-1713-9
  • Electronic_ISBN
    978-1-4673-1712-2
  • Type

    conf

  • DOI
    10.1109/ICSMC.2012.6377871
  • Filename
    6377871