DocumentCode :
2467665
Title :
Noise factors in dftection of minute marks by domain wall displacement
Author :
Kaneko, M. ; Yoshimura, S. ; Fujita, G.
Author_Institution :
Sony Corporation
fYear :
2000
fDate :
9-13 April 2000
Firstpage :
579
Lastpage :
579
Keywords :
Error analysis; Intersymbol interference; Jitter; Magnetic analysis; Magnetic fields; Magnetic modulators; Magnetic noise; Noise shaping; Pattern analysis; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
Type :
conf
DOI :
10.1109/INTMAG.2000.872354
Filename :
872354
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2467665
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