Title :
A simulation framework for estimating wall stress distribution of abdominal aortic aneurysm
Author :
Qin, Jing ; Zhang, Jing ; Chui, Chee-Kong ; Huang, Wei-Min ; Yang, Tao ; Pang, Wai-Man ; Sudhakar, Venkatesh ; Chang, Stephen
Author_Institution :
Department of Diagnostic Radiology, National University of Singapore
fDate :
Aug. 30 2011-Sept. 3 2011
Abstract :
Abdominal aortic aneurysm (AAA) rupture is believed to occur when the mechanical stress acting on the wall exceeds the strength of the wall tissue. In endovascular aneurysm repair, a stent-graft in a catheter is released at the aneurysm site to form a new blood vessel and protect the weakened AAA wall from the pulsatile pressure and, hence, possible rupture. In this paper, we propose a framework to estimate the wall stress distribution of non-stented/stented AAA based on fluid-structure interaction, which is utilized in a surgical simulation system (IRAS). The 3D geometric model of AAA is reconstructed from computed tomography angiographic (CTA) images. Based on our experiments, a combined logarithm and polynomial strain energy equation is applied to model the elastic properties of arterial wall. The blood flow is modeled as laminar, incompressible, and non-Newtonian flow by applying Navier-Stokes equation. The obtained pressure of blood flow is applied as load on the AAA meshes with and without stent-graft and the wall stress distribution is calculated by fluid-structure interaction (FSI) solver equipped in ANSYS. Experiments demonstrate that our analytical results are consistent with clinical observations.
Keywords :
Aneurysm; Biological system modeling; Blood; Computational modeling; Mathematical model; Strain; Stress; Aortic Aneurysm, Abdominal; Blood Flow Velocity; Blood Pressure; Blood Vessel Prosthesis; Computer Simulation; Elastic Modulus; Humans; Models, Cardiovascular; Shear Strength; Stents; Stress, Mechanical; Tomography, X-Ray Computed;
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2011.6090201