• DocumentCode
    2467776
  • Title

    Modeling current transport in carbon nanotube transistors

  • Author

    Pourfath, Mahdi ; Selberherr, Siegfried

  • Author_Institution
    Inst. for Microelectron., TU Wien, Vienna
  • fYear
    2008
  • fDate
    8-10 Dec. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Carbon nanotubes (CNTs) have been studied in recent years due to their exceptional electronic, opto-electronic, and mechanical properties. To explore the physics of carbon nanotube field-effect transistors (CNT-FETs) self-consistent quantum mechanical simulations have been performed. Both the electron-photon and electron-phonon interactions in CNT-FETs have been analyzed numerically, employing the non-equilibrium Greenpsilas function formalism. The numerical challenges for the analysis of carbon nanotube based photo-detectors have been investigated. The results indicate the non-locality of electron-photon interaction. For accurate analysis it is essential to include many off-diagonals of the electron-photon self-energy. Electron-phonon interaction parameters, such as electron-phonon coupling strength and phonon energy, strongly depend on the chirality and the diameter of the carbon nanotube. The steady-state and the dynamic response of carbon nanotube based transistors have been studied for a wide range of electron-phonon interaction parameters.
  • Keywords
    Green´s function methods; carbon nanotubes; electron-phonon interactions; field effect transistors; nanotube devices; photodetectors; semiconductor nanotubes; C; carbon nanotube field-effect transistors; current transport; dynamic response; electron-phonon coupling strength; electron-phonon interactions; electron-photon interactions; electron-photon self-energy; nonequilibrium Green´s function; phonon energy; photo-detectors; self-consistent quantum mechanical simulations; CNTFETs; Carbon nanotubes; Charge carrier processes; Green´s function methods; MOSFETs; Mechanical factors; Microelectronics; Optoelectronic devices; Photonic band gap; Physics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits, 2008. EDSSC 2008. IEEE International Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-2539-6
  • Electronic_ISBN
    978-1-4244-2540-2
  • Type

    conf

  • DOI
    10.1109/EDSSC.2008.4760743
  • Filename
    4760743