DocumentCode
2467837
Title
A valuation for clear stain and its behaver on helical scan tape system
Author
Nagai, N. ; Kamatani, Y. ; Kondo, M. ; Ozue, T.
Author_Institution
Sony Corporation
fYear
2000
fDate
9-13 April 2000
Firstpage
589
Lastpage
589
Keywords
Atomic force microscopy; Cost accounting; Frequency measurement; Magnetic heads; Microwave integrated circuits; Optical losses; Optical microscopy; Optical recording; System testing; Virtual manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location
Toronto, ON, Canada
Print_ISBN
0-7803-5943-7
Type
conf
DOI
10.1109/INTMAG.2000.872364
Filename
872364
Link To Document