Thermal and electrical transport in carbon nanofiber interconnects

Author

Saito, Tsutomu ; Yamada, Toshishige ; Fabris, Drazen ; Kitsuki, Hirohiko ; Wilhite, Patrick ; Yang, Cary Y.

Author_Institution

Center for Nanostruct., Santa Clara Univ., Santa Clara, CA

fYear

2008

fDate

8-10 Dec. 2008

Firstpage

1

Lastpage

4

Abstract

To study the reliability of carbon nanofibers (CNFs) under high-current stress, electrical measurements of CNF breakdown are performed for four configurations: (a) suspended, (b) supported, (c) suspended with tungsten deposited onto the CNF-electrode contact, and (d) supported with tungsten deposition. Supported CNF has enhanced current capacity, consistent with improved heat transport to the substrate, and depositing W to the electrodes lowers the contact resistance and improves the overall electrical characteristics of the system.

Keywords

carbon nanotubes; electric breakdown; reliability; thermal stresses; C; breakdown; carbon nanofiber interconnects; electrical transport; heat transport; high-current stress; reliability; supported configuration; suspended configuration; thermal transport; Contact resistance; Electric breakdown; Electric variables; Electric variables measurement; Electrodes; Performance evaluation; Resistance heating; Stress measurement; Thermal stresses; Tungsten;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices and Solid-State Circuits, 2008. EDSSC 2008. IEEE International Conference on

Conference_Location

Hong Kong

Print_ISBN

978-1-4244-2539-6

Electronic_ISBN

978-1-4244-2540-2

Type

conf

DOI

10.1109/EDSSC.2008.4760749

Filename

4760749