Reproducibility of the switching behavior of sub micron ferromagnetic tunnel junctions
Author :
Klostermann, U.K. ; Zoll, S. ; Leuschner, R. ; Elain, K. ; Bar, L. ; Rupp, G. ; Gieres, G. ; Bangert, J. ; Kinder, R. ; van den Berg, H. ; Wecker, J.
Author_Institution :
Siemens AG/Infineon Technologies
fYear :
2000
fDate :
9-13 April 2000
Firstpage :
595
Lastpage :
595
Keywords :
Artificial intelligence; Electrodes; Lithography; Magnetic fields; Magnetic separation; Magnetic switching; Reproducibility of results; Resists; Shape; Soft magnetic materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
