DocumentCode :
2467926
Title :
InGaAs and graphene as high mobility channels for post Si-CMOS applications
Author :
Ye, Peide D.
Author_Institution :
Sch. of Electr. & Comput. Eng. & Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN
fYear :
2008
fDate :
8-10 Dec. 2008
Firstpage :
1
Lastpage :
5
Abstract :
The continuous device scaling and performance improvements required by the International Technology Roadmap of Semiconductors (ITRS) are facing a grand challenge as conventional Si CMOS scaling comes to its fundamental physical limits. We review the research progress recently at Purdue University using In-rich InGaAs and epitaxial graphene on SiC as the novel channel materials for post Si CMOS applications suitable for the 15 nm node and beyond.
Keywords :
CMOS integrated circuits; III-V semiconductors; MOSFET; gallium arsenide; graphene; indium compounds; nanostructured materials; semiconductor epitaxial layers; C; InGaAs; Si CMOS scaling; SiC; channel materials; device scaling; epitaxial graphene; graphene MOSFET; high mobility channels; post Si-CMOS applications; size 15 nm; Aluminum oxide; FETs; Gallium arsenide; HEMTs; High-K gate dielectrics; III-V semiconductor materials; Indium gallium arsenide; MODFETs; MOSFETs; Molecular beam epitaxial growth;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices and Solid-State Circuits, 2008. EDSSC 2008. IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-2539-6
Electronic_ISBN :
978-1-4244-2540-2
Type :
conf
DOI :
10.1109/EDSSC.2008.4760751
Filename :
4760751
Link To Document :
بازگشت