Title :
Reliability prediction based on degradation measure distribution and wavelet neural network
Author :
Dang, Xiangjun ; Jiang, Tongmin
Author_Institution :
Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
Abstract :
To avoid the errors caused by pseudo life prediction in degradation testing, this paper proposes a reliability prediction method based on degradation measure distribution and wavelet neural network. The style of degradation measure distribution is assumed to be unchangeable during degradation procedure, while the character parameters, such as location and scale parameters, are time-dependent covariates. Therefore, the evaluations of character parameters are critical factors for prediction results. To predict the character parameters, different wavelet neural network prediction models are established. The learning algorithm of wavelet neural network is Levenberg-Marquardt algorithm combining the advantages of both Gauss-Newton algorithm and fast gradient descent algorithm. Practical degradation data are utilized to verify the proposed method. Considering that data may not be intact in engineering, reliability prediction of partial degradation data is also implemented and the result is acceptable.
Keywords :
gradient methods; learning (artificial intelligence); least squares approximations; neural nets; reliability; testing; wavelet transforms; Gauss-Newton algorithm; Levenberg-Marquardt algorithm; character parameters; degradation measure distribution; degradation procedure; degradation testing; fast gradient descent algorithm; learning algorithm; location parameters; partial degradation data; pseudo life prediction; reliability prediction method; scale parameters; time-dependent covariates; wavelet neural network prediction models; Argon; Hazards; Polynomials; Prediction algorithms; Predictive models; Reliability; degradation measure distribution; reliability prediction; wavelet neural network;
Conference_Titel :
Prognostics and System Health Management (PHM), 2012 IEEE Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4577-1909-7
Electronic_ISBN :
2166-563X
DOI :
10.1109/PHM.2012.6228782