Title :
Electron transport in thin insulating films; physics and effects on dielectric aging
Author :
Pfluger, P. ; Cartier, E. ; Dersch, H.
Author_Institution :
Asea Brown Boveri Corp. Res., Baden-Dattwil, Switzerland
Abstract :
In dielectrics under high electrical fields, the energy distribution of the conduction electrons, N(E,F), plays a decisive role. Experimental methods (mainly vacuum spectroscopic techniques) are presented which make it possible to measure the energy distribution of conduction electrons, N(E). Its field dependence, N(E,F), can also be determined if the scattering rates for the carriers are known in the energy range of interest. Results obtained for saturated hydrocarbon and SiO/sub 2/ thin films are discussed.<>
Keywords :
ageing; electron energy loss spectra; electronic conduction in insulating thin films; high field effects; photoemission; SiO/sub 2/ thin films; carrier scattering rates; conduction electron energy distribution; dielectric aging; electron transport; high electrical fields; hydrocarbon thin films; thin insulating films; vacuum spectroscopic techniques; Dielectric measurements; Dielectric thin films; Dielectrics and electrical insulation; Electrons; Elementary particle vacuum; Energy measurement; Physics; Scattering; Spectroscopy; Vacuum technology;
Conference_Titel :
Electrical Insulation, 1988., Conference Record of the 1988 IEEE International Symposium on
Conference_Location :
Cambridge, MA, USA
DOI :
10.1109/ELINSL.1988.13887
