Title :
Current status and future of testability assessment technology
Author :
Li, Gang ; Ma, Yanheng ; Zhao, Weiwei ; Xu, Yajun
Author_Institution :
Dept. of Opt. & Electron. Eng., Mech. Eng. Coll., Shijiazhuang, China
Abstract :
Current testability assessment technologies and methods are introduced in this paper first. Then the advantages, disadvantages and applicable occasions are analyzed carefully. This paper studies future trend based on the former analysis and puts forward two new testability assessment methods at last.
Keywords :
reliability; telecommunication equipment testing; information fusion; testability assessment technology; assessment; information fusion; testabiltty;
Conference_Titel :
Prognostics and System Health Management (PHM), 2012 IEEE Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4577-1909-7
Electronic_ISBN :
2166-563X
DOI :
10.1109/PHM.2012.6228790
