DocumentCode
2468121
Title
Current status and future of testability assessment technology
Author
Li, Gang ; Ma, Yanheng ; Zhao, Weiwei ; Xu, Yajun
Author_Institution
Dept. of Opt. & Electron. Eng., Mech. Eng. Coll., Shijiazhuang, China
fYear
2012
fDate
23-25 May 2012
Firstpage
1
Lastpage
4
Abstract
Current testability assessment technologies and methods are introduced in this paper first. Then the advantages, disadvantages and applicable occasions are analyzed carefully. This paper studies future trend based on the former analysis and puts forward two new testability assessment methods at last.
Keywords
reliability; telecommunication equipment testing; information fusion; testability assessment technology; assessment; information fusion; testabiltty;
fLanguage
English
Publisher
ieee
Conference_Titel
Prognostics and System Health Management (PHM), 2012 IEEE Conference on
Conference_Location
Beijing
ISSN
2166-563X
Print_ISBN
978-1-4577-1909-7
Electronic_ISBN
2166-563X
Type
conf
DOI
10.1109/PHM.2012.6228790
Filename
6228790
Link To Document