• DocumentCode
    2468139
  • Title

    Surface flashover phenomena at vacuum/oil interface

  • Author

    Sharma, Ashok ; Nagesh, K.V. ; Sethi, R.C. ; Kumar, Uday ; Nagabhushana, G.R.

  • Author_Institution
    Accelerator & Pulse Power Div., Bhabha Atomic Res. Centre, Mumbai, India
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    232
  • Lastpage
    233
  • Abstract
    Summary form only given. The present paper presents experimental results of oil/solid and vacuum/solid interface flashover studies under varying experimental conditions, viz. (i) effect of input dV/dt: 50 to 400 kV/μs, (ii) angle of spacer: +70° to -70° and (iii) thickness of spacer: 1 to 3 mm. In a hollow insulator, the inner surface is a vacuum/solid interface and the outer surface of the insulator represents an oil/solid interface. Transformer oil and PMMA are used as oil and solid medium respectively. A statistical distribution of the flashover voltage for oil/solid interface has been done with N=10 samples. Even though the Weibull distribution is used in the case of spark gaps and different insulation breakdown studies, the present study is an exception and follows a normal distribution within 99% confidence limits. This may be due to the randomness in breakdown voltage due to inherent non-uniformity in the presence of a spacer in the uniform gap regime.
  • Keywords
    electric breakdown; flashover; normal distribution; organic insulating materials; surface discharges; transformer oil; vacuum insulation; PMMA; breakdown voltage randomness; dielectric strength; flashover voltage; hollow insulator; normal distribution; oil/solid interface; pulse excitation; spacer angle; statistical distribution; submicrosecond regime; surface flashover phenomena; transformer oil; vacuum/oil interface; Electric breakdown; Flashover; Gaussian distribution; Oil insulation; Petroleum; Power transformer insulation; Solids; Spark gaps; Statistical distributions; Weibull distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, 2002. IVEC 2002. Third IEEE International
  • Print_ISBN
    0-7803-7256-5
  • Type

    conf

  • DOI
    10.1109/IVELEC.2002.999354
  • Filename
    999354