DocumentCode :
2468160
Title :
The research on electronic equipment´s testability integrated demonstration
Author :
Yin, Yuanwei ; Chaoxuan, Shang ; Yanheng Ma ; Gang, Li
Author_Institution :
Dept. of Opt. & Electron. Eng., Ordnance Eng. Coll., Shijiazhuang, China
fYear :
2012
fDate :
23-25 May 2012
Firstpage :
1
Lastpage :
4
Abstract :
Methods of testability demonstration in electronic equipments are: inherent testability analysis, experimental demonstration and simulated demonstration. Each of these methods yield different aspects of the level of equipment´s testability, but the result is isolated and there are no connections with each method. In order to overcome this weakness, this paper combines many aspects of testability to achieve a full-scale and objective result to increase confidence.
Keywords :
electronic equipment testing; electronic equipments; experimental demonstration; simulated demonstration; testability analysis; testability demonstration; Neodymium; Nickel; Noise measurement; Demonstrate method; Integrate Demonstration; Testability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Prognostics and System Health Management (PHM), 2012 IEEE Conference on
Conference_Location :
Beijing
ISSN :
2166-563X
Print_ISBN :
978-1-4577-1909-7
Electronic_ISBN :
2166-563X
Type :
conf
DOI :
10.1109/PHM.2012.6228792
Filename :
6228792
Link To Document :
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