• DocumentCode
    2468160
  • Title

    The research on electronic equipment´s testability integrated demonstration

  • Author

    Yin, Yuanwei ; Chaoxuan, Shang ; Yanheng Ma ; Gang, Li

  • Author_Institution
    Dept. of Opt. & Electron. Eng., Ordnance Eng. Coll., Shijiazhuang, China
  • fYear
    2012
  • fDate
    23-25 May 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Methods of testability demonstration in electronic equipments are: inherent testability analysis, experimental demonstration and simulated demonstration. Each of these methods yield different aspects of the level of equipment´s testability, but the result is isolated and there are no connections with each method. In order to overcome this weakness, this paper combines many aspects of testability to achieve a full-scale and objective result to increase confidence.
  • Keywords
    electronic equipment testing; electronic equipments; experimental demonstration; simulated demonstration; testability analysis; testability demonstration; Neodymium; Nickel; Noise measurement; Demonstrate method; Integrate Demonstration; Testability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Prognostics and System Health Management (PHM), 2012 IEEE Conference on
  • Conference_Location
    Beijing
  • ISSN
    2166-563X
  • Print_ISBN
    978-1-4577-1909-7
  • Electronic_ISBN
    2166-563X
  • Type

    conf

  • DOI
    10.1109/PHM.2012.6228792
  • Filename
    6228792