DocumentCode :
2468290
Title :
Effect of the intrinsic layer thickness on the spectral performance of p-i-n structure 4H-SiC ultraviolet photodetector
Author :
Chen, Xiaping ; Wu, Zhengyun ; Zhu, Huili
Author_Institution :
Physics Department & MEMS Research Center, Xiamen University, Fujian, 361005, China
fYear :
2011
fDate :
24-26 June 2011
Firstpage :
5918
Lastpage :
5921
Abstract :
The absorption coefficients of 4H-SiC at 200 – 400 nm were obtained by extrapolation and polynomial fitting methods. Considering the effect of different junction-depth on the spectral performance, the continuity equations of photo-generated minority carrier were used to theoretically calculate the responsivity of p+-n(i)-n-n+ structure 4H-SiC ultraviolet photodetector (PD) and to find out the effect of the intrinsic layer thickness on the spectral performance. The theoretical analyses can be applied to the practical design of p-i-n structure 4H-SiC PDs.
Keywords :
Absorption; Electronic mail; Neodymium; PIN photodiodes; Physics; Silicon carbide; 4H-SiC; intrinsic layer; p-i-n PDs; spectral performance; theoretical analyse;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Remote Sensing, Environment and Transportation Engineering (RSETE), 2011 International Conference on
Conference_Location :
Nanjing, China
Print_ISBN :
978-1-4244-9172-8
Type :
conf
DOI :
10.1109/RSETE.2011.5965701
Filename :
5965701
Link To Document :
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