• DocumentCode
    2468344
  • Title

    The good, the bad, and the ugly of silicon debug

  • Author

    Josephson, Doug

  • Author_Institution
    Intel Corp., Fort Collins, CO
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    3
  • Lastpage
    6
  • Abstract
    Silicon debug begins with the arrival of design prototypes and can continue well after a product has gone into production. It is perhaps the most exciting and challenging stage of the integrated circuit development process. This paper gives an overview of silicon debug, and describes tools and methods used during the debug process
  • Keywords
    integrated circuit design; integrated circuit testing; design prototypes; integrated circuit development; silicon debug; Circuit testing; Computer bugs; Frequency; Logic circuits; Logic design; Logic devices; Manufacturing processes; Process design; Silicon; Voltage; Debug; Design; characterization; design for test and debug; validation; verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2006 43rd ACM/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    1-59593-381-6
  • Type

    conf

  • DOI
    10.1109/DAC.2006.238674
  • Filename
    1688750
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2468344