• DocumentCode
    2468644
  • Title

    DAC technologist panel "the IC nanometer race - what will it take to win"

  • Author

    Rhines, W.C. ; Parker, L. ; Singer, G. ; Magarshack, P. ; Buss, D. ; Fu-Chieh Hsu ; Ho-Kyu Kang

  • Author_Institution
    Mentor Graphics, Wilsonville, OR
  • fYear
    2006
  • fDate
    24-28 July 2006
  • Firstpage
    77
  • Lastpage
    78
  • Abstract
    Creating ICs in the nanometer age is a high-stakes race that few companies can afford to compete in - and even fewer can win. Hear how senior technologists from the world´s top technology companies are striving to improve their chances of success. Will leakage constraints force power-sensitive applications to stay with older technologies, or will there be a bifurcation to a new process technology? Will ballooning capital equipment expenses delay new capacity or price out design rules for mainstream applications? Will silicon-on-insulator and new device structures like FinFETs force rethinking of design, modeling and simulation methodologies? And which EDA technologies, delivered when, will be critical for victory? These senior technologists, from some of the biggest companies in the high tech industry, will discuss and debate how they think the overall industry will successfully transition to the nanometer age. Specific examples from the technologists´ broad exposure to industry trends and competitors will help illustrate their forecasts and predictions
  • Keywords
    integrated circuit design; nanoelectronics; device structures; integrated circuit nanometer; leakage constraints; process technology; silicon-on-insulator; Application specific integrated circuits; Bifurcation; Costs; Delay; Economic forecasting; FinFETs; Graphics; Instruments; Semiconductor device manufacture; Silicon on insulator technology; Design; Hardware; economics; management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2006 43rd ACM/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    1-59593-381-6
  • Type

    conf

  • DOI
    10.1109/DAC.2006.229168
  • Filename
    1688764