DocumentCode :
2468644
Title :
DAC technologist panel "the IC nanometer race - what will it take to win"
Author :
Rhines, W.C. ; Parker, L. ; Singer, G. ; Magarshack, P. ; Buss, D. ; Fu-Chieh Hsu ; Ho-Kyu Kang
Author_Institution :
Mentor Graphics, Wilsonville, OR
fYear :
2006
fDate :
24-28 July 2006
Firstpage :
77
Lastpage :
78
Abstract :
Creating ICs in the nanometer age is a high-stakes race that few companies can afford to compete in - and even fewer can win. Hear how senior technologists from the world´s top technology companies are striving to improve their chances of success. Will leakage constraints force power-sensitive applications to stay with older technologies, or will there be a bifurcation to a new process technology? Will ballooning capital equipment expenses delay new capacity or price out design rules for mainstream applications? Will silicon-on-insulator and new device structures like FinFETs force rethinking of design, modeling and simulation methodologies? And which EDA technologies, delivered when, will be critical for victory? These senior technologists, from some of the biggest companies in the high tech industry, will discuss and debate how they think the overall industry will successfully transition to the nanometer age. Specific examples from the technologists´ broad exposure to industry trends and competitors will help illustrate their forecasts and predictions
Keywords :
integrated circuit design; nanoelectronics; device structures; integrated circuit nanometer; leakage constraints; process technology; silicon-on-insulator; Application specific integrated circuits; Bifurcation; Costs; Delay; Economic forecasting; FinFETs; Graphics; Instruments; Semiconductor device manufacture; Silicon on insulator technology; Design; Hardware; economics; management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2006 43rd ACM/IEEE
Conference_Location :
San Francisco, CA
ISSN :
0738-100X
Print_ISBN :
1-59593-381-6
Type :
conf
DOI :
10.1109/DAC.2006.229168
Filename :
1688764
Link To Document :
بازگشت