DocumentCode :
246873
Title :
Path loss measurements for low-antenna links in urban street environments
Author :
Juyul Lee ; Myung Don Kim ; Jinup Kim ; Hyun Kyu Chung
Author_Institution :
Electron. & Telecommun. Res. Inst. (ETRI), Daejeon, South Korea
fYear :
2014
fDate :
6-11 July 2014
Firstpage :
957
Lastpage :
958
Abstract :
This paper presents line-of-sight (LoS) path loss characteristics for low-antenna links in urban street environments to account for propagation channels in mobile-to-mobile direct communications. The key variables, from the perspective of horizontal and vertical planes of such environments, are street width and surrounding building height. In this paper, we investigate the effects of the environmental variables on path loss, based on measurement campaigns. To emulate a mobile-to-mobile direct communication link, both a transmitter and a receiver are installed in vehicles so that the antennas are held to near-street levels. Path loss measurements are collected at a carrier frequency of 3.7 GHz with an omni 1×4-antenna configuration. The measured results show that the building height does affect the path loss behavior, but that the street width does not. In particular, the path loss exponent after the break point decreases as the building height increases.
Keywords :
microwave antennas; microwave propagation; mobile antennas; mobile communication; omnidirectional antennas; receiving antennas; transmitting antennas; LoS path loss characteristics; environmental variables; horizontal planes; line-of-sight path loss characteristics; low-antenna links; mobile-to-mobile direct communication link; near-street levels; omni antenna configuration; path loss measurements; propagation channels; receiver; street width; surrounding building height; transmitter; urban street environments; vertical planes; Antenna measurements; Buildings; Frequency measurement; Loss measurement; Propagation losses; Receivers; Transmitters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium (APSURSI), 2014 IEEE
Conference_Location :
Memphis, TN
ISSN :
1522-3965
Print_ISBN :
978-1-4799-3538-3
Type :
conf
DOI :
10.1109/APS.2014.6904807
Filename :
6904807
Link To Document :
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