DocumentCode :
2468788
Title :
A fast simultaneous input vector generation and gate replacement algorithm for leakage power reduction
Author :
Cheng, Lei ; Deng, Liang ; Chen, Deming ; Wong, Martin D F
Author_Institution :
Coordinated Sci. Lab., Illinois Univ., Urbana, IL
fYear :
0
fDate :
0-0 0
Firstpage :
117
Lastpage :
120
Abstract :
Input vector control (IVC) technique is based on the observation that the leakage current in a CMOS logic gate depends on the gate input state, and a good input vector is able to minimize the leakage when the circuit is in the sleep mode. The gate replacement technique is a very effective method to further reduce the leakage current. In this paper, we propose a fast algorithm to find a low leakage input vector with simultaneous gate replacement. Results on MCNC91 benchmark circuits show that our algorithm produces 14% better leakage current reduction with several orders of magnitude speedup in runtime for large circuits compared to the previous state-of-the-art algorithm. In particular, the average runtime for the ten largest combinational circuits has been dramatically reduced from 1879 seconds to 0.34 seconds
Keywords :
CMOS logic circuits; combinational circuits; integrated circuit design; leakage currents; 0.34 sec; 1879 sec; CMOS logic gate; combinational circuits; gate replacement algorithm; input vector control; input vector generation; leakage current reduction; leakage power reduction; CMOS logic circuits; Controllability; Dynamic programming; Genetic algorithms; Iterative algorithms; Leakage current; Logic gates; Power generation; Runtime; Vectors; Algorithm; Input vector control; Performance; gate replacement; leakage reduction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2006 43rd ACM/IEEE
Conference_Location :
San Francisco, CA
ISSN :
0738-100X
Print_ISBN :
1-59593-381-6
Type :
conf
DOI :
10.1109/DAC.2006.229188
Filename :
1688773
Link To Document :
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