• DocumentCode
    2468947
  • Title

    From frequency-domain, physics-based modeling to time-domain simulation of high data-rate performance II: non-linear gain with memory

  • Author

    Safier, P.N. ; Antonsen, T., Jr. ; Qiu, J. ; Danly, B.G. ; Levush, B.

  • Author_Institution
    Sci. Applications Int. Corp., McLean, VA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    316
  • Lastpage
    317
  • Abstract
    Summary form only given. The explosive growth in telecommunications dictates the use of digital modulation techniques in wireless systems, and amplifiers for these systems must meet criteria that are usually specified in the time-domain. However, the physics-based nonlinear simulation of amplifiers such as traveling-wave tubes (TWTs) has been implemented traditionally in the frequency-domain, and traditional amplifier performance specifications usually relate to frequency domain properties. Thus, the impact of trade-offs of amplifier properties on digital signal performance is not directly obtainable. This is particularly true if the device under consideration has internal reflections that produce a frequency response with structure over the bandwidth of the digital signal, thus introducing significant memory effects. Here we present a new model that incorporates frequency dependence into the non-linear gain, i.e. a non-linear gain with memory.
  • Keywords
    digital communication; frequency response; nonlinear network analysis; radiofrequency amplifiers; time-domain analysis; travelling wave amplifiers; RF amplifier time domain simulation; TWT; amplifier performance; device internal reflections; digital communication amplifiers; digital modulation techniques; digital signal bandwidth; digital signal performance; frequency dependence; frequency response memory effects; frequency-domain analysis; high data rate performance analysis; memory effects; nonlinear gain; physics-based nonlinear simulation; structured frequency response; traveling-wave tubes; wireless systems; Band pass filters; Bit error rate; Frequency dependence; Laboratories; Performance gain; Plasma applications; Reflection; Shape control; Time domain analysis; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference, 2002. IVEC 2002. Third IEEE International
  • Print_ISBN
    0-7803-7256-5
  • Type

    conf

  • DOI
    10.1109/IVELEC.2002.999398
  • Filename
    999398