• DocumentCode
    2469116
  • Title

    Fast analysis of structured power grid by triangularization based structure preserving model order reduction

  • Author

    Yu, Hao ; Shi, Yiyu ; He, Lei

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    205
  • Lastpage
    210
  • Abstract
    In this paper, a triangularization based structure preserving (TBS) model order reduction is proposed to verify power integrity of on-chip structured power grid. The power grid is represented by interconnected basic blocks according to current density, and basic blocks are further clustered into compact blocks, each with a unique pole distribution. Then, the system is transformed into a triangular system, where compact blocks are in its diagonal and the system poles are determined only by the diagonal blocks. Finally, projection matrices are constructed and applied for compact blocks separately. The resulting macromodel has more matched poles and is more accurate than the one using flat projection. It is also sparse and enables a two-level analysis for simulation time reduction. Compared to existing approaches, TBS in experiments achieves up to 133times and 109times speedup in macromodel building and simulation respectively, and reduces waveform error by 33times
  • Keywords
    current density; integrated circuit design; integrated circuit modelling; poles and zeros; reduced order systems; macromodel building; macromodel simulation; model order reduction; pole distribution; power integrity; projection matrices; structured power grid; triangularization based structure preserving; Algorithm design and analysis; Buildings; Circuit simulation; Costs; Current density; Helium; Impedance matching; Integrated circuit interconnections; Power grids; Transfer functions; Algorithms; Model Order Reduction; PG grid simulation; design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2006 43rd ACM/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    1-59593-381-6
  • Type

    conf

  • DOI
    10.1109/DAC.2006.229195
  • Filename
    1688790