DocumentCode :
2469289
Title :
Feature selection with stochastic complexity
Author :
Dom, Byron ; Niblack, Wayne ; Sheinvald, Jacob
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
fYear :
1989
fDate :
4-8 Jun 1989
Firstpage :
241
Lastpage :
248
Abstract :
The application of J. Rissanen´s theory (1986) of stochastic complexity to the problem of features selection in statistical pattern recognition (SPR) is discussed. Stochastic complexity provides a general framework for statistical problems such as coding, prediction, estimation, and classification. A brief review of the SPR paradigm and traditional methods of feature selection is presented, followed by a discussion of the basic of stochastic complexity. Two forms of stochastic complexity, minimum description length and an integral form, are applied to the problem of feature selection. Experimental results using simulated data generated with Gaussian distributions are given and compared with results from cross validation, a traditional technique. The stochastic complexity measures give superior results, as measured by their ability to select subsets of relevant features, as well as probability of error computed based on the selected feature subset
Keywords :
error statistics; pattern recognition; picture processing; statistical analysis; stochastic programming; Gaussian distributions; Rissanen´s theory; coding; error probability; features selection; picture processing; prediction; statistical pattern recognition; stochastic complexity; Cognition; Computational modeling; Gaussian distribution; Jacobian matrices; Length measurement; Pattern recognition; Probability; Q measurement; Stochastic processes; Training data;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition, 1989. Proceedings CVPR '89., IEEE Computer Society Conference on
Conference_Location :
San Diego, CA
ISSN :
1063-6919
Print_ISBN :
0-8186-1952-x
Type :
conf
DOI :
10.1109/CVPR.1989.37856
Filename :
37856
Link To Document :
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