Title :
Partial response maximum likelihood detection for perpendicular recordfng
Author :
Oenning, T. ; Jaekyun Moon
Author_Institution :
University of Minnesota
Keywords :
Colored noise; Detectors; Frequency domain analysis; Inspection; Maximum likelihood detection; Moon; Perpendicular magnetic recording; Shape; Signal processing; Transient response;
Conference_Titel :
Magnetics Conference, 2000. INTERMAG 2000 Digest of Technical Papers. 2000 IEEE International
Conference_Location :
Toronto, ON, Canada
Print_ISBN :
0-7803-5943-7
DOI :
10.1109/INTMAG.2000.872459