DocumentCode
2469346
Title
A fast passivity test for descriptor systems via structure-preserving transformations of skew-Hamiltonian/Hamiltonian matrix pencils
Author
Wong, N. ; Chu, C.K.
Author_Institution
Dept. of Electr. & Electron. Engg., Hong Kong Univ., Kowloon
fYear
0
fDate
0-0 0
Firstpage
261
Lastpage
266
Abstract
Passivity in a VLSI model is an important property to guarantee stable global simulation. Most VLSI models are naturally described as descriptor systems (DSs) or singular state spaces. Passivity tests for DSs, however, are much less developed compared to their non-singular state space counterparts. For large-scale DSs, the existing test based on linear matrix inequality (LMI) is computationally prohibitive. Other system decoupling techniques involve complicated coding and sometimes ill-conditioned transformations. This paper proposes a simple DS passivity test based on the key insight that the sum of a passive system and its adjoint must be impulse-free. A sidetrack shows that the proper (non-impulsive) part of a passive DS can be easily decoupled along the test flow. Numerical examples confirm the effectiveness of the proposed DS passivity test over conventional approaches
Keywords
VLSI; integrated circuit modelling; integrated circuit testing; network analysis; VLSI model; descriptor systems; fast passivity test; linear matrix inequality; passive system; singular state spaces; skew-Hamiltonian matrix pencils; structure-preserving transformations; system decoupling techniques; Computational modeling; Decision support systems; Impulse testing; Large-scale systems; Linear matrix inequalities; Permission; Riccati equations; State-space methods; System testing; Very large scale integration; Algorithms; Descriptor system; passivity test; positive real;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2006 43rd ACM/IEEE
Conference_Location
San Francisco, CA
ISSN
0738-100X
Print_ISBN
1-59593-381-6
Type
conf
DOI
10.1109/DAC.2006.229221
Filename
1688800
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