Title :
A test pattern ordering algorithm for diagnosis with truncated fail data
Author :
Chen, Gang ; Reddy, Sudhakar M. ; Pomeranz, Irith ; Rajski, Janusz
Author_Institution :
Mentor Graphics Corp., Wilsonville, OR
Abstract :
In this paper, we propose a test pattern ordering algorithm for fault diagnosis. Test pattern ordering is effective in situations where the fail log is truncated and contains a limited number of fail data. In such cases, higher diagnostic resolution can be achieved with the test set appropriately ordered. Test pattern ordering is independent of the diagnosis algorithm used. The higher resolution achieved by test pattern ordering is obtained at no additional cost once the test patterns have been appropriately ordered. Experimental results on two industrial designs are presented to demonstrate the effectiveness of the proposed method
Keywords :
automatic test pattern generation; fault diagnosis; fault tolerance; integrated circuit testing; fault diagnosis; industrial design; test pattern ordering; truncated fail data; Circuit faults; Circuit testing; Dictionaries; Fault detection; Fault diagnosis; Graphics; Integrated circuit modeling; Integrated circuit reliability; Integrated circuit testing; Semiconductor device testing; Algorithms; Reliability; Test pattern ordering; diagnosis; truncated fail data;
Conference_Titel :
Design Automation Conference, 2006 43rd ACM/IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
1-59593-381-6
DOI :
10.1109/DAC.2006.229215
