• DocumentCode
    2470008
  • Title

    Study of enhancement test and limit criterion determining method for Inertial navigation products

  • Author

    Xu, Dan ; Chen, Yunxia ; Kang, Rui

  • Author_Institution
    Sch. of Reliability & Syst. Eng., Beihang Univ., Beijing, China
  • fYear
    2012
  • fDate
    23-25 May 2012
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Due to the influences of time and external environment, key parameters of Inertial navigation products are led into drift, which influence the storage life and reliability of inertial navigation products. The enhancement experiment is one of the most important taches and content in accelerated test technology. It is conducted to rapidly challenge the potential defects in the product design by applying far more environmental and working stress than the design specification to the specimen, and then defects would be reflected in fault types. According to the analysis of influence factors to parameters´ drift, the storage data over the years and exist storage profile, temperature and vibration are the main factors in storage process for accelerometer. Therefore, the enhancement test is consisted of low temperature step-stress test, high temperature step-stress test, rapid temperature change cycling test and vibration step-stress test. After the enhancement tests are implemented, the latent fault mechanism and the fault location are integratedly given. Finally, a kind of determining method for the limit based on mechanism invariability is advanced; at the same time, the operating limit, damage limit and other quantitative parameters to corresponding stress are obtained. That will help engineers to know the performance of the accelerometer and undergo the accelerated degradation test.
  • Keywords
    accelerometers; inertial navigation; life testing; accelerated degradation test; enhancement test; fault location; high temperature step stress test; inertial navigation products; latent fault mechanism; limit criterion determining method; low temperature step stress test; parameter drift; rapid temperature change cycling test; storage data; storage process; storage profile; vibration step stress test; Navigation; Reliability; Testing; Vibrations; accelerometer; enhancement test; limit criterio; parameter stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Prognostics and System Health Management (PHM), 2012 IEEE Conference on
  • Conference_Location
    Beijing
  • ISSN
    2166-563X
  • Print_ISBN
    978-1-4577-1909-7
  • Electronic_ISBN
    2166-563X
  • Type

    conf

  • DOI
    10.1109/PHM.2012.6228880
  • Filename
    6228880