Title :
Complex permittivity measurements of extremely low loss dielectric materials using whispering gallery modes
Author :
Krupka, J. ; Derzakowski, K. ; Abramowicz, A. ; Tobar, Michael ; Geyer, R.G.
Author_Institution :
Inst. Mikroelektroniki i Optoelektroniki PW, Warsaw, Poland
Abstract :
Whispering-gallery modes are used for very accurate complex permittivity measurements of both isotropic and uniaxially anisotropic dielectric materials. A mode-matching technique is used to find the relationship between the complex permittivity, resonant frequency, and the dimensions of a resonant structure. The total uncertainty in permittivity is smaller than 0.05 percent and is limited principally by uncertainty in sample dimensions.
Keywords :
dielectric materials; dielectric resonators; microwave measurement; mode matching; permittivity measurement; complex permittivity measurement; dielectric resonator; isotropic material; low loss dielectric material; mode-matching; uniaxially anisotropic material; whispering gallery modes; Anisotropic magnetoresistance; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Loss measurement; Permittivity measurement; Resonance; Temperature; Whispering gallery modes;
Conference_Titel :
Microwave Symposium Digest, 1997., IEEE MTT-S International
Conference_Location :
Denver, CO, USA
Print_ISBN :
0-7803-3814-6
DOI :
10.1109/MWSYM.1997.596578
