DocumentCode
2470148
Title
Optimal simultaneous mapping and clustering for FPGA delay optimization
Author
Lin, Joey Y. ; Chen, Deming ; Cong, Jason
Author_Institution
Magma Design Autom., Santa Clara, CA
fYear
0
fDate
0-0 0
Firstpage
472
Lastpage
477
Abstract
Both technology mapping and circuit clustering have a large impact on FPGA designs in terms of circuit performance, area, and power dissipation. Existing FPGA design flows carry out these two synthesis steps sequentially. Such a two-step approach cannot guarantee that the final delay of the circuit is optimal, because the quality of clustering depends significantly on the initial mapping result. To address this problem, we develop an algorithm that performs mapping and clustering simultaneously and optimally under a widely used clustering delay model. To our knowledge, our algorithm, named SMAC (simultaneous mapping and clustering) is the first delay-optimal algorithm to generate a synthesis solution that considers a combination of both steps. Compared to a synthesis flow using state-of-the-art mapping and clustering algorithms DAOmap (Chen and Cong, 2004) + T-VPACK (Marquardt, 1999) - SMAC achieves a 25% performance gain with a 22% area overhead under the clustering delay model. After placement and routing, SMAC is 12% better in performance
Keywords
delay estimation; dynamic programming; electronic design automation; field programmable gate arrays; integrated circuit design; DAOmap; FPGA delay optimization; FPGA designs; SMAC; T-VPACK; area overhead; circuit clustering; delay-optimal algorithm; dynamic programming; optimal simultaneous mapping; routing; simultaneous mapping and clustering; technology mapping; Circuit synthesis; Clustering algorithms; Delay; Design optimization; Field programmable gate arrays; Logic arrays; Logic devices; Network synthesis; Simultaneous localization and mapping; Table lookup; Algorithms; Design; Experimentation; FPGA; Performance; clustering; dynamic programming; technology mapping;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2006 43rd ACM/IEEE
Conference_Location
San Francisco, CA
ISSN
0738-100X
Print_ISBN
1-59593-381-6
Type
conf
DOI
10.1109/DAC.2006.229262
Filename
1688844
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