DocumentCode
2470262
Title
Control-based approach to broadband viscoelastic spectroscopy: PDMS example
Author
Xu, Zhonghua ; Zou, Qingze ; Shrotriya, Pranav ; Xie, Ping
Author_Institution
Mech. Eng., Iowa State Univ., Ames, IA, USA
fYear
2009
fDate
10-12 June 2009
Firstpage
1652
Lastpage
1657
Abstract
In this article, a novel nanoscale broadband viscoelastic spectroscopy approach is proposed. The proposed approach utilizes the recently developed model-less inversion-based iterative control (MIIC) technique for accurate measurement of the material response to the applied excitation force over a broad frequency band. Current nanomechanical measurement is slow and narrow-banded and thus not capable of measuring rate-dependent phenomena of materials. In the proposed approach, an input force signal with dynamic characteristics of band-limited white-noise is utilized to rapidly excite the nanomechanical response of the material over a broad frequency range. Then, the MIIC technique is used to compensate for the hardware adverse effects, thereby allowing the precise applications of such an excitation force and measurement of the material response (to the applied force). The proposed approach is illustrated by implementing it to measure the creep compliance of poly(dimethylsiloxane) (PDMS) over a broad frequency range over 3 orders of magnitude.
Keywords
iterative methods; spectroscopy; PDMS example; band-limited white-noise; input force signal; material response measurement; model-less inversion-based iterative control technique; nanomechanical measurement; nanoscale broadband viscoelastic spectroscopy approach; Creep; Current measurement; Elasticity; Force control; Force measurement; Frequency measurement; Hardware; Iterative methods; Spectroscopy; Viscosity;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 2009. ACC '09.
Conference_Location
St. Louis, MO
ISSN
0743-1619
Print_ISBN
978-1-4244-4523-3
Electronic_ISBN
0743-1619
Type
conf
DOI
10.1109/ACC.2009.5160355
Filename
5160355
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