Title :
Systematic temperature sensor allocation and placement for microprocessors
Author :
Mukherjee, Rajarshi ; Memik, Seda Ogrenci
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Northwestern Univ., Evanston, IL
Abstract :
Modern high performance processors employ advanced techniques for thermal management, which rely on accurate readings of on-die thermal sensors. As the importance of thermal effects on reliability and performance of integrated circuits increases careful planning and embedding of thermal monitoring mechanisms into these systems are crucial. Systematic tools for analysis of thermal behavior and determination of best allocation and placement of thermal sensing elements is therefore a highly relevant problem. In this paper, we propose novel optimization techniques for determining the optimal locations and allocations for thermal sensors to provide a high fidelity thermal profile of a complex microprocessor system. Our algorithm identifies an optimal physical location for each sensor such that the sensor´s attraction towards steep thermal gradient is maximized. We also present a hybrid allocation and placement strategy showing the trade-offs associated with number of sensors used and expected accuracy. Our results show that our tool is able to create a sensor distribution for a given microprocessor architecture providing thermal measurements with maximum error of 3.18degC and average maximum error of 1.63degC across a wide set of applications
Keywords :
microprocessor chips; temperature measurement; temperature sensors; thermal management (packaging); 1.63 C; 3.18 C; complex microprocessor system; high fidelity thermal profile; microprocessor architecture; optimization techniques; steep thermal gradient; temperature sensor allocation; temperature sensor placement; thermal measurements; thermal sensors; Computer errors; Computerized monitoring; Microprocessors; Modems; Sensor systems; Temperature dependence; Temperature sensors; Thermal engineering; Thermal management; Thermal sensors; Algorithms; Allocation; Experimentation; Measurement; Placement; Sensor; Temperature;
Conference_Titel :
Design Automation Conference, 2006 43rd ACM/IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
1-59593-381-6
DOI :
10.1109/DAC.2006.229218