Title :
Modeling cortical source dynamics and interactions during seizure
Author :
Mullen, Tim ; Acar, Zeynep Akalin ; Worrell, Gregory ; Makeig, Scott
fDate :
Aug. 30 2011-Sept. 3 2011
Abstract :
Mapping the dynamics and spatial topography of brain source processes critically involved in initiating and propagating seizure activity is critical for effective epilepsy diagnosis, intervention, and treatment. In this report we analyze neuronal dynamics before and during epileptic seizures using adaptive multivariate autoregressive (VAR) models applied to maximally-independent (ICA) sources of intracranial EEG (iEEG, ECoG) data recorded from subdural electrodes implanted in a human patient for evaluation of surgery for epilepsy. We visualize the spatial distribution of causal sources and sinks of ictal activity on the cortical surface (gyral and sulcal) using a novel combination of multivariate Granger-causal and graph-theoretic metrics combined with distributed source localization by Sparse Bayesian Learning applied to a multi-scale patch basis. This analysis reveals and visualizes distinct, seizure stage-dependent shifts in inter-component spatiotemporal dynamics and connectivity including the clinically-identified epileptic foci.
Keywords :
Bayes methods; electroencephalography; medical disorders; regression analysis; Sparse Bayesian Learning; adaptive multivariate autoregressive models; brain source process; cortical source dynamics; epilepsy diagnosis; epilepsy intervention; epilepsy treatment; ictal activity; intracranial EEG; multiscale patch basis; seizure; spatial topography; subdural electrodes; Adaptation models; Biological system modeling; Brain models; Electroencephalography; Integrated circuit modeling; Algorithms; Brain; Brain Mapping; Computer Simulation; Diagnosis, Computer-Assisted; Electroencephalography; Epilepsy; Humans; Models, Neurological; Nerve Net; Reproducibility of Results; Sensitivity and Specificity;
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2011.6090332