• DocumentCode
    2471284
  • Title

    Modeling of high voltage 4H-SiC JFETs and MOSFETs for power electronics applications

  • Author

    Yi Wang ; Cass, Callaway ; Tang, Ke ; Naik, Harsh ; Chow, T. Paul ; Boroyevich, Dushan ; Wang, Yi

  • Author_Institution
    Rensselaer Polytech. Inst., Troy, NY
  • fYear
    2008
  • fDate
    15-19 June 2008
  • Firstpage
    4758
  • Lastpage
    4761
  • Abstract
    Silicon carbide (SiC), with its high critical electric field property and the capability of operation at high temperature, has attracted much attention and shown to be a promising semiconductor material for high power devices. Some of the most widely used devices in power circuits are the JFETs and the MOSFETs. Based on characterization of high voltage 4H-SiC JFET and MOSFET, this work compares the using of these two kinds of devices in power systems from both electrical and thermal points of view and compact models are developed for circuit simulations.
  • Keywords
    electric fields; junction gate field effect transistors; power MOSFET; semiconductor device models; semiconductor materials; silicon compounds; MOSFET modeling; SiC; electric field property; high temperature; high voltage JFET modeling; power electronics applications; power systems devices; semiconductor material; Circuits; JFETs; MOSFETs; Power electronics; Power system modeling; Power system simulation; Semiconductor materials; Silicon carbide; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 2008. PESC 2008. IEEE
  • Conference_Location
    Rhodes
  • ISSN
    0275-9306
  • Print_ISBN
    978-1-4244-1667-7
  • Electronic_ISBN
    0275-9306
  • Type

    conf

  • DOI
    10.1109/PESC.2008.4592722
  • Filename
    4592722