DocumentCode
2471284
Title
Modeling of high voltage 4H-SiC JFETs and MOSFETs for power electronics applications
Author
Yi Wang ; Cass, Callaway ; Tang, Ke ; Naik, Harsh ; Chow, T. Paul ; Boroyevich, Dushan ; Wang, Yi
Author_Institution
Rensselaer Polytech. Inst., Troy, NY
fYear
2008
fDate
15-19 June 2008
Firstpage
4758
Lastpage
4761
Abstract
Silicon carbide (SiC), with its high critical electric field property and the capability of operation at high temperature, has attracted much attention and shown to be a promising semiconductor material for high power devices. Some of the most widely used devices in power circuits are the JFETs and the MOSFETs. Based on characterization of high voltage 4H-SiC JFET and MOSFET, this work compares the using of these two kinds of devices in power systems from both electrical and thermal points of view and compact models are developed for circuit simulations.
Keywords
electric fields; junction gate field effect transistors; power MOSFET; semiconductor device models; semiconductor materials; silicon compounds; MOSFET modeling; SiC; electric field property; high temperature; high voltage JFET modeling; power electronics applications; power systems devices; semiconductor material; Circuits; JFETs; MOSFETs; Power electronics; Power system modeling; Power system simulation; Semiconductor materials; Silicon carbide; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics Specialists Conference, 2008. PESC 2008. IEEE
Conference_Location
Rhodes
ISSN
0275-9306
Print_ISBN
978-1-4244-1667-7
Electronic_ISBN
0275-9306
Type
conf
DOI
10.1109/PESC.2008.4592722
Filename
4592722
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