DocumentCode
24715
Title
A New Double Input-Double Output Complex Envelope Amplifier Behavioral Model Taking Into Account Source and Load Mismatch Effects
Author
Zargar, H. ; Banai, A. ; Pedro, J.C.
Author_Institution
Dept. of Electr. Eng., Sharif Univ. of Technol., Tehran, Iran
Volume
63
Issue
2
fYear
2015
fDate
Feb. 2015
Firstpage
766
Lastpage
774
Abstract
This paper presents a double input-double output bilateral low-pass equivalent amplifier behavioral model that takes into account input source and output load termination mismatches. The model is intended for the system-level simulation of amplifier chains subjected to wideband modulated signals, since it can predict the device´s input and output scattered waves and their memory effects, in a wide range of voltage standing wave ratios (VSWR). In addition, the model extraction methodology, and its associated laboratory test bench are discussed, noting the limitations of conventional setups for behavioral model extraction and validation. The model is validated comparing the predicted and measured data of a real 15 W GaN based PA circuit attached to different loads. The obtained results show that, in terms of normalized mean square error, this model can provide -30 dB for VSWR in comparison to a much poorer performance of the conventional single input-single output model.
Keywords
III-V semiconductors; gallium compounds; mean square error methods; modulation; power amplifiers; wide band gap semiconductors; wideband amplifiers; GaN; PA circuit; VSWR; bilateral low-pass equivalent amplifier behavioral model; double input-double output complex envelope amplifier behavioral model; gain -30 dB; load termination mismatch effect; memory effect; model extraction methodology; normalized mean square error; power 15 W; single input-single output model; system-level simulation; voltage standing wave ratio; wideband modulated signal; Data models; Harmonic analysis; Integrated circuit modeling; Load modeling; Mathematical model; Measurement uncertainty; Polynomials; Behavioral modeling; load mismatch; memory effects; nonlinear circuits; power amplifiers;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2014.2387842
Filename
7012120
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