• DocumentCode
    24715
  • Title

    A New Double Input-Double Output Complex Envelope Amplifier Behavioral Model Taking Into Account Source and Load Mismatch Effects

  • Author

    Zargar, H. ; Banai, A. ; Pedro, J.C.

  • Author_Institution
    Dept. of Electr. Eng., Sharif Univ. of Technol., Tehran, Iran
  • Volume
    63
  • Issue
    2
  • fYear
    2015
  • fDate
    Feb. 2015
  • Firstpage
    766
  • Lastpage
    774
  • Abstract
    This paper presents a double input-double output bilateral low-pass equivalent amplifier behavioral model that takes into account input source and output load termination mismatches. The model is intended for the system-level simulation of amplifier chains subjected to wideband modulated signals, since it can predict the device´s input and output scattered waves and their memory effects, in a wide range of voltage standing wave ratios (VSWR). In addition, the model extraction methodology, and its associated laboratory test bench are discussed, noting the limitations of conventional setups for behavioral model extraction and validation. The model is validated comparing the predicted and measured data of a real 15 W GaN based PA circuit attached to different loads. The obtained results show that, in terms of normalized mean square error, this model can provide -30 dB for VSWR in comparison to a much poorer performance of the conventional single input-single output model.
  • Keywords
    III-V semiconductors; gallium compounds; mean square error methods; modulation; power amplifiers; wide band gap semiconductors; wideband amplifiers; GaN; PA circuit; VSWR; bilateral low-pass equivalent amplifier behavioral model; double input-double output complex envelope amplifier behavioral model; gain -30 dB; load termination mismatch effect; memory effect; model extraction methodology; normalized mean square error; power 15 W; single input-single output model; system-level simulation; voltage standing wave ratio; wideband modulated signal; Data models; Harmonic analysis; Integrated circuit modeling; Load modeling; Mathematical model; Measurement uncertainty; Polynomials; Behavioral modeling; load mismatch; memory effects; nonlinear circuits; power amplifiers;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2014.2387842
  • Filename
    7012120