Title : 
A time-variant reliability approach for mechanical structures for non-linear behaviour
         
        
            Author : 
Wang, Xianchao ; Zhang, Jianguo ; Wang, Cancan ; Wang, Feng ; Liu, Zhan
         
        
            Author_Institution : 
Dept. of Syst. Eng., BeiHang Univ., Beijing, China
         
        
        
        
        
        
            Abstract : 
Assessing efficiently the lifetime of aging mechanical components structures needs taking into account the random and temporal character of material properties, environmental conditions and loads. Time-variant reliability methods are a way to deal with this source of concern. Combined with the theory of reliability design and the method durability, computation method of time-dependent reliability of mechanical components is set based on models of time-dependent reliability. A realistic prediction of the durability of industrial-type structures also requires considering non-linear material behavior induced by plasticity, damage, etc. Therefore this paper has presented the PHI2 method for solving time-variant reliability problems and is illustrated on the example of a side beam submitted to a random load.
         
        
            Keywords : 
ageing; durability; plasticity; reliability; structural engineering; PHI2 method; aging mechanical components structures; environmental conditions; industrial-type structures durability; material properties; mechanical components; mechanical structures; nonlinear behaviour; nonlinear material behavior; plasticity; realistic prediction; reliability design theory; temporal character; time-dependent reliability; time-dependent reliability computation method; time-variant a reliability approach; time-variant reliability methods; time-variant reliability problems; Load modeling; Predictive models; Reliability; Non-linear; Out-crossing rate; PHI2 method; Time-variant reliability;
         
        
        
        
            Conference_Titel : 
Prognostics and System Health Management (PHM), 2012 IEEE Conference on
         
        
            Conference_Location : 
Beijing
         
        
        
            Print_ISBN : 
978-1-4577-1909-7
         
        
            Electronic_ISBN : 
2166-563X
         
        
        
            DOI : 
10.1109/PHM.2012.6228958