DocumentCode :
2472089
Title :
Structural and light-emission properties of bulk Germanium islands grown on Silicon using Molecular Beam Epitaxy
Author :
Nataraj, L. ; Sustersic, N. ; Coppinger, M. ; Gerlein, F. ; Kolodzey, J. ; Cloutier, S.G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Delaware, Newark, DE, USA
fYear :
2009
fDate :
9-11 Sept. 2009
Firstpage :
190
Lastpage :
192
Abstract :
We report on the optoelectronic properties of bulk Germanium islands formed on Silicon by Molecular Beam Epitaxy. More specifically, we will discuss the role of strains and doping in favoring efficient light-emission at telecommunication wavelengths.
Keywords :
band structure; elemental semiconductors; germanium; island structure; molecular beam epitaxial growth; photoluminescence; semiconductor doping; semiconductor epitaxial layers; semiconductor growth; Ge:B; Ge:P; MBE; Si; band structure; band-to-band recombination; bulk germanium islands; dome islands; doping; light emission; molecular beam epitaxy; nonradiative recombination; optoelectronic properties; photoluminescence; structural properties; superdome islands; telecommunication wavelengths; CMOS technology; Capacitive sensors; Doping; Germanium alloys; Germanium silicon alloys; Microelectronics; Molecular beam epitaxial growth; Radiative recombination; Silicon germanium; Spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Group IV Photonics, 2009. GFP '09. 6th IEEE International Conference on
Conference_Location :
San Francisco, CA
ISSN :
1949-2081
Print_ISBN :
978-1-4244-4402-1
Electronic_ISBN :
1949-2081
Type :
conf
DOI :
10.1109/GROUP4.2009.5338321
Filename :
5338321
Link To Document :
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