Title :
Application of probes with multiple outputs on probe-compensated EMC near-field measurements
Author :
Spang, Matthias ; Stoeckel, Tina ; Schubert, Goeran ; Albach, Manfred
Author_Institution :
Dept. of Electromagn. Fields, Friedrich-Alexander-Universtiy Erlangen-Nuremberg, Erlangen, Germany
Abstract :
Near-field scanning has become a popular measurement technique in the field of electromagnetic compatibility. This paper presents the application of probe compensation techniques to near-field measurements using probes with multiple outputs. The technique, which is based on plane wave theory, enables the calculation of the electric and magnetic field components above a device under test. Results based on measurements are shown for the case of a short electric dipole probe with two outputs.
Keywords :
electric field measurement; electromagnetic compatibility; electromagnetic wave propagation; electron probes; magnetic field measurement; electric dipole probe; electric field components; electromagnetic compatibility; magnetic field components; near-field scanning; plane wave theory; probe compensated EMC near field measurements; probe compensation techniques; Antenna measurements; Calibration; Circuit testing; Electric variables measurement; Electromagnetic compatibility; Electromagnetic fields; Electromagnetic interference; Electromagnetic measurements; Magnetic field measurement; Probes; EMC; Near-field scan; Plane wave theory; Probe calibration; Probe compensation;
Conference_Titel :
Industrial Technology (ICIT), 2010 IEEE International Conference on
Conference_Location :
Vi a del Mar
Print_ISBN :
978-1-4244-5695-6
Electronic_ISBN :
978-1-4244-5696-3
DOI :
10.1109/ICIT.2010.5472677
