Application of probes with multiple outputs on probe-compensated EMC near-field measurements

Author

Spang, Matthias ; Stoeckel, Tina ; Schubert, Goeran ; Albach, Manfred

Author_Institution

Dept. of Electromagn. Fields, Friedrich-Alexander-Universtiy Erlangen-Nuremberg, Erlangen, Germany

fYear

2010

fDate

14-17 March 2010

Firstpage

188

Lastpage

193

Abstract

Near-field scanning has become a popular measurement technique in the field of electromagnetic compatibility. This paper presents the application of probe compensation techniques to near-field measurements using probes with multiple outputs. The technique, which is based on plane wave theory, enables the calculation of the electric and magnetic field components above a device under test. Results based on measurements are shown for the case of a short electric dipole probe with two outputs.

Keywords

electric field measurement; electromagnetic compatibility; electromagnetic wave propagation; electron probes; magnetic field measurement; electric dipole probe; electric field components; electromagnetic compatibility; magnetic field components; near-field scanning; plane wave theory; probe compensated EMC near field measurements; probe compensation techniques; Antenna measurements; Calibration; Circuit testing; Electric variables measurement; Electromagnetic compatibility; Electromagnetic fields; Electromagnetic interference; Electromagnetic measurements; Magnetic field measurement; Probes; EMC; Near-field scan; Plane wave theory; Probe calibration; Probe compensation;

fLanguage

English

Publisher

ieee

Conference_Titel

Industrial Technology (ICIT), 2010 IEEE International Conference on

Conference_Location

Vi a del Mar

Print_ISBN

978-1-4244-5695-6

Electronic_ISBN

978-1-4244-5696-3

Type

conf

DOI

10.1109/ICIT.2010.5472677

Filename

5472677