DocumentCode :
247236
Title :
Characterization of Phase-Change Material Using Verilog-A and its Validation as a Memory Element
Author :
Dwivedi, A.K. ; Kumari, S. ; Islam, A.
Author_Institution :
Birla Inst. of Technol., Electron. & Commun. Eng., Ranchi, India
fYear :
2014
fDate :
12-13 Sept. 2014
Firstpage :
1
Lastpage :
5
Abstract :
This paper presents SPICE modeling of Phase-change Random Access Memory (PCRAM). Different models of PCRAM have been already proposed but those models still lack capability to exactly model the behavior of PCRAM. In this paper we have introduced various physical parameters in the programming, to accurately model PCRAM behavior. The modeling of PCRAM cell has been done in Verilog-A and simulation results have been extensively verified using SPICE. Further, we have integrated the proposed model with the modified CNFET based read-write circuit. This paper emerges with the successful modeling of R-I characteristics of PCRAM. Read and write operations with proper programming pulses have also been demonstrated in this paper.
Keywords :
SPICE; carbon nanotube field effect transistors; hardware description languages; phase change materials; phase change memories; PCRAM cell; R-I characteristics; SPICE modeling; Verilog-A; memory element; modified CNFET based read-write circuit; phase-change material; phase-change random access memory; physical parameters; programming pulses; Conductivity; Heating; Integrated circuit modeling; Materials; Phase change random access memory; Resistance; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Devices, Circuits and Communications (ICDCCom), 2014 International Conference on
Conference_Location :
Ranchi
Type :
conf
DOI :
10.1109/ICDCCom.2014.7024702
Filename :
7024702
Link To Document :
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