DocumentCode :
2472452
Title :
7E-5 Temperature Coefficients Measured by Picosecond Ultrasonics on Materials in Thin Films for Bulk Acoustic Wave Technology
Author :
Emery, P. ; Petit, D. ; Ancey, P. ; Devos, A.
Author_Institution :
STMicroelectronics, Crolles
fYear :
2007
fDate :
28-31 Oct. 2007
Firstpage :
612
Lastpage :
615
Abstract :
To achieve standards specifications bulk acoustic wave (BAW) resonators have to be temperature compensated. This resonators consist on multilayer stack of different materials: a piezoelectric stack composed of two electrodes at the top and bottom of a piezoelectric layer, and an acoustic isolation. The temperature compensation is usually done by increasing the thickness of a silicon dioxide layer which presents a positive temperature coefficient. In order to improve and predict the behavior of the device, temperature coefficients of the different materials of the device have to be characterized. In this paper we present measurements of the dependence of sound velocity versus temperature by picosecond ultrasonics.
Keywords :
acoustic resonators; bulk acoustic wave devices; piezoelectric thin films; ultrasonic measurement; BAW resonators; acoustic isolation; bulk acoustic wave resonators; picosecond ultrasonics; piezoelectric layer; temperature coefficient; thin films; Acoustic materials; Acoustic measurements; Acoustic waves; Isolation technology; Nonhomogeneous media; Piezoelectric films; Piezoelectric materials; Temperature measurement; Transistors; Ultrasonic variables measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2007. IEEE
Conference_Location :
New York, NY
ISSN :
1051-0117
Print_ISBN :
978-1-4244-1384-3
Electronic_ISBN :
1051-0117
Type :
conf
DOI :
10.1109/ULTSYM.2007.159
Filename :
4409732
Link To Document :
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