DocumentCode :
2472666
Title :
Analysis of heavy-metal-ions using mercury microelectrodes and a solid-state reference electrode fabricated on a Si wafer
Author :
Yun, Kwang-Seok ; Kim, Hong-Jeortg ; Joo, Segyeong ; Kwak, Juhyoun ; Yoon, Euisik
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Seoul, South Korea
fYear :
2000
fDate :
11-13 July 2000
Firstpage :
72
Lastpage :
73
Abstract :
We have fabricated micro working electrodes and a reference electrode using semiconductor processes for electrochemical detection of heavy-metal-ions. The stripping voltammetry using mercury electrodes has been used to detect trace concentration of ions. If the applied potential to the mercury electrode is negative than the standard redox potentials of heavy-metal-ions, then the ions existing in liquid are amalgamated into the mercury electrode. After this preconcentration process for a few minutes, the potential is increased linearly in the apposite direction and the amalgamated metals are stripped out into solution. By measuring the current peaks while sweeping the voltage, we can find heavy-metal-ions and their concentrations dissolved in the liquid.
Keywords :
electrochemical electrodes; mercury (metal); microelectrodes; voltammetry (chemical analysis); Hg; Si; electrochemical detection; heavy metal ion concentration analysis; mercury microelectrode; semiconductor processing; silicon wafer; solid-state reference electrode; stripping voltammetry; Current measurement; Electrodes; Gold; Mercury (metals); Microelectrodes; Platinum; Silicon; Solid state circuits; Substrates; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2000 International
Conference_Location :
Tokyo, Japan
Print_ISBN :
4-89114-004-6
Type :
conf
DOI :
10.1109/IMNC.2000.872628
Filename :
872628
Link To Document :
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