DocumentCode
2472666
Title
Analysis of heavy-metal-ions using mercury microelectrodes and a solid-state reference electrode fabricated on a Si wafer
Author
Yun, Kwang-Seok ; Kim, Hong-Jeortg ; Joo, Segyeong ; Kwak, Juhyoun ; Yoon, Euisik
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Seoul, South Korea
fYear
2000
fDate
11-13 July 2000
Firstpage
72
Lastpage
73
Abstract
We have fabricated micro working electrodes and a reference electrode using semiconductor processes for electrochemical detection of heavy-metal-ions. The stripping voltammetry using mercury electrodes has been used to detect trace concentration of ions. If the applied potential to the mercury electrode is negative than the standard redox potentials of heavy-metal-ions, then the ions existing in liquid are amalgamated into the mercury electrode. After this preconcentration process for a few minutes, the potential is increased linearly in the apposite direction and the amalgamated metals are stripped out into solution. By measuring the current peaks while sweeping the voltage, we can find heavy-metal-ions and their concentrations dissolved in the liquid.
Keywords
electrochemical electrodes; mercury (metal); microelectrodes; voltammetry (chemical analysis); Hg; Si; electrochemical detection; heavy metal ion concentration analysis; mercury microelectrode; semiconductor processing; silicon wafer; solid-state reference electrode; stripping voltammetry; Current measurement; Electrodes; Gold; Mercury (metals); Microelectrodes; Platinum; Silicon; Solid state circuits; Substrates; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocesses and Nanotechnology Conference, 2000 International
Conference_Location
Tokyo, Japan
Print_ISBN
4-89114-004-6
Type
conf
DOI
10.1109/IMNC.2000.872628
Filename
872628
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