DocumentCode :
2472957
Title :
8E-4 Perfectly Matched Layer Finite Element Simulation of Parasitic Acoustic Wave Radiation in Microacoustic Devices
Author :
Mayer, Markus ; Zaglmayr, Sabine ; Wagner, Karl ; Schöberl, Joachim
Author_Institution :
EPCOS AG, Munich
fYear :
2007
fDate :
28-31 Oct. 2007
Firstpage :
702
Lastpage :
706
Abstract :
Classical finite element methods are only capable of describing a limited computation area; the substrate of a micro-acoustic device must therefore be described by suitable boundary conditions. This is obtained by absorbing boundary conditions (ABC) or perfectly matched layers (PML) which both suppress reflections from the substrate. PML was implemented into a high-performance finite element code. The employed variant of the PML approach relies on a complex variable transformation of the basic piezoelectric equations in the PML layer. Harmonic admittances of a system with aluminum electrodes on a 42deg YX- LiTaO3 substrate are determined with PML and ABC methods and compared to FEM/BEM results, which can be considered as exact solution of the piezoelectric half space problem. The results of PML approach FEM/BEM, while the ABC results deviate. The correct adjustment of PML parameters to minimize reflection at the substrate/PML interface is illustrated by visualizations of the wave fields.
Keywords :
acoustic devices; acoustic field; acoustic materials; acoustic wave absorption; acoustic wave reflection; aluminium; electrodes; finite element analysis; lithium compounds; micromechanical devices; piezoelectric devices; piezoelectric materials; Al; BEM; LiTaO3; absorbing boundary conditions; aluminum electrodes; harmonic admittances; microacoustic devices; parasitic acoustic wave radiation; perfectly matched layer finite element simulation; piezoelectric equations; piezoelectric half space problem; reflection suppression; wave field visualizations; Acoustic reflection; Acoustic waves; Aluminum; Boundary conditions; Computational modeling; Electrodes; Equations; Finite element methods; Perfectly matched layers; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2007. IEEE
Conference_Location :
New York, NY
ISSN :
1051-0117
Print_ISBN :
978-1-4244-1384-3
Electronic_ISBN :
1051-0117
Type :
conf
DOI :
10.1109/ULTSYM.2007.181
Filename :
4409754
Link To Document :
بازگشت