Title :
Benefits of high resolution SAR for ATR of targets in proximity
Author :
Bajcsy, Peter ; Chaudhuri, Anirban Ray
Author_Institution :
Nat. Center for Supercomput. Applications, Champaign, IL, USA
Abstract :
In this work we present a new extraction and matching algorithms that enable to perform automatic target recognition (ATR) in high-resolution synthetic aperture radar (SAR) data and targets in proximity. Our motivation was to show benefits of high-resolution SAR for ATR and extend the current capabilities of ATR algorithms for targets in extended operating conditions (EOCs), for example, targets in proximity. We develop a new extraction algorithm for target signatures represented by a point pattern. Each point pattern is extracted using a resolution independent SAR peak model. Test and prototype target signatures are compared with a new matching algorithm. The matching algorithm is capable of identifying multiple signatures in a test point pattern. An experimental evaluation of ATR performance for targets in proximity at multiple data resolution is conducted. The contribution of this work is in (a) developing a peak extraction algorithm that uses a resolution independent SAR peak model, (b) designing a new matching algorithm that can identify multiple signatures in a single test pattern, (c) evaluating ATR performance for targets in proximity at multiple data resolutions.
Keywords :
feature extraction; image matching; radar imaging; radar resolution; radar target recognition; synthetic aperture radar; ATR; automatic target recognition; extended operating conditions; extraction; high resolution SAR; high-resolution synthetic aperture radar data; matching algorithms; multiple data resolution; multiple signatures; peak extraction; resolution independent model; target signatures; targets in proximity; Algorithm design and analysis; Computer applications; Data mining; Feature extraction; Gaussian distribution; Pattern matching; Prototypes; Synthetic aperture radar; Target recognition; Testing;
Conference_Titel :
Radar Conference, 2002. Proceedings of the IEEE
Print_ISBN :
0-7803-7357-X
DOI :
10.1109/NRC.2002.999688