Title :
Ultra compact and high reliable SiC MOSFET power module with 200°C operating capability
Author :
Horio, Masafumi ; Iizuka, Yuji ; Ikeda, Yoshinari ; Mochizuki, Eiji ; Takahashi, Yoshikazu
Author_Institution :
Electron. Device Lab., Fuji Electr. Co., Ltd., Matsumoto, Japan
Abstract :
Aluminium wirebond-less power module structure was investigated and presented in ISPSD 2011 [1]. The features of this structure are high-density packaging with Copper pins connection and power circuit board, low thermal resistance with thick Copper block on Silicon Nitride ceramic substrate and high reliability with epoxy resin moulding. This paper introduces Silicon Carbide MOSFET power module with this developed structure. High temperature operating capability up to 200°C is achieved with newly developed epoxy resin and Silver sintering technology. Low internal inductance is designed by laminating current paths to take an advantage of developed structure. SiC MOSFET 100A/1200V module was designed. Loss evaluation with this SiC module shows superior performance with SiC devices and also with developed structure.
Keywords :
aluminium; copper; power MOSFET; resins; semiconductor device packaging; semiconductor device reliability; silicon compounds; silver; sintering; wide band gap semiconductors; MOSFET power module; SiC; aluminium wirebond-less power module structure; ceramic substrate; copper pins connection; current 100 A; epoxy resin moulding; high density packaging; internal inductance; loss evaluation; power circuit board; silver sintering technology; temperature 200 degC; thermal resistance; voltage 1200 V; Ceramics; Epoxy resins; Inductance; Multichip modules; Periodic structures; Silicon; Silicon carbide; SiC power module; Silver sintering; epoxy resin moulding;
Conference_Titel :
Power Semiconductor Devices and ICs (ISPSD), 2012 24th International Symposium on
Conference_Location :
Bruges
Print_ISBN :
978-1-4577-1594-5
Electronic_ISBN :
1943-653X
DOI :
10.1109/ISPSD.2012.6229028