Title :
Combining global and local vision for technical document understanding
Author :
Ramel, Jean-Yves ; Vincent, Nicole ; Emptoz, Hubert
Author_Institution :
Lab. RFV, Inst. Nat. des Sci. Appliques, Lyon, France
Abstract :
We have implemented a method that describes as precisely as possible all the shapes of an original technical drawing during each level of the analysis. We integrate the natural techniques that normally associated with human perception, and our new representation model provides both essential information about the image and ways to manage this information. It enables a global vision on which the study of the document can be based. Some local analyses confirm, invalidate or improve this information and make the context and the representation evolve in order to obtain data of a higher semantic level
Keywords :
computer vision; document handling; document image processing; engineering graphics; image matching; image recognition; document image analysis; global vision; image matching; local vision; quadrilaterals; representation model; semantic level; shape analysis; technical document understanding; technical drawing; Data mining; Feature extraction; Humans; Image analysis; Image segmentation; Information analysis; Information management; Shape; Technical drawing; Text analysis;
Conference_Titel :
Pattern Recognition, 1996., Proceedings of the 13th International Conference on
Conference_Location :
Vienna
Print_ISBN :
0-8186-7282-X
DOI :
10.1109/ICPR.1996.547273